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| Facilities The overall properties of materials are often dominated by the properties of their surfaces and interfaces. No single technique or instrument can provide the level of information required to develop a clear understadning of these structures. For example, scanning probe microscopy (SPM) allows morphological characterization of materials down to an atomic scale in parallel with measurements of several physical properties, including capacitance, conductance, magnetism, and hardness. However, it does not provide detailed information about the chemical nature of the material. Imaging electron spectroscopy for chemical analysis (ESCA) and Auger provides detailed information on the elemental makeup of materials and information on chemical bonding, but it cannot provide morphological information and has limited sensitivity for some elements. Secondary ion mass spectrometry (SIMS) provides exquisite sensitivity for all the elements, but provides only indirect information about the bonding and structure of materials. Only collectively do these instrumental techniques provide the complete view of materials and interfaces that is required in cutting-edge research. Scanning
probe microscopy (SPM) Additional materials characterization facilities at the University of Manitoba
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