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Scanning Probe Microscopy (SPM) The scanning probe microscope in the facility is a powerful tool for examining the properties of surfaces with nanometer resolution. Scanning probe microscopy will provide the nanometer-scale topographic images that complete the picture of surfaces and interfaces provided by the other techniques ESCA/Auger and SIMS. The research carried out in this facility will make use of several types and configurations of SPMs. Generally, an SPM system is composed of two parts. First is the stage which manipulates the probe and sample. Second is the controller which provides the controlling signals to the stage and acts as the user interface. The controller electronics in this instrument will be easily modified to provide control of all voltages and access to all control signals that are required to adapt the controller to many specialized and unique applications that previously have been limited to custom-built instruments. For example, it will be possible to utilize probe techniques based on high frequency potential imaging that are currently being developed at the University of Manitoba (Thomson). These sorts of techniques will be unique in Canada and will lead to important new insights into the structure and properties of monolayers, dielectrics and polymer films. |
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