Thomson is a pioneer in the
development of SPM for microelectronics and surface diagnostics. He has
invented and co-invented several important SPM techniques that have resulted
in breakthroughs in the characterization of microelectronic devices, both
spatially and structurally. He will use ESCA/Auger to develop a more detailed
understanding of the imaging mechanisms involved in these SPM techniques,
and will extend this capability and understanding to diverse areas such
as nanoelectronics and complex geological samples.
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