Equipment
The following is a list of the available equipment at the NSFL. For equipment bookings please contact the NSFL lab staff. In the near future an on-line booking system will be setup for convenience.
Cleanroom
1000 ft. sq. of class 10 - 100 cleanroom
Thin-film Deposition
Dual source thermal evaporator
RF/DC/RF bias 4 target sputtering system
Semicore/KJL super system RF/DC/RF bias 6 target co-sputter system
PETS high/low frequency PECVD system (SiH4, H2, NH3, NO2, N2, O2, CF4)
Dry Etching, Plasma Etching
Xenon difluoride (XeF2) etching system
Trion RIE / ICP plasma etcher (SF6, CF4, CHF3, O2, Ar)
Jelight 144A UV ozone cleaner
PETS table top plasma etcher / RIE system (SF6, CF4, CHF3, O2, Ar)
Oxford A-Series picosecond laser micromachining system (to be installed)
High Temperature Processing
Lindburg/Blue-M quartz tube furnace for wet/dry oxidation
Lindburg/Blue-M quartz tube furnace for diffusion
Lindburg/Blue-M programmable muffle furnace
Allwin21 AccuThermo AW610 rapid thermal process system
Vacuum anodic bonding system
Lithography
ABM 6 inch contact mask aligner, with IR backside alignment
Karl Suss 3 inch contact mask aligner
Machine World positive photoresist spinner
Machine World positive photoresist spin developer
Machine World vacuum soft bake hot plate
Solitec positive photoresist spinner and developer
Isotemp oven
YES-5 HMDS oven
4' processing wet deck
5' fume hood and spinner for negative resist, SU-8, PDMS
Wet Processing
6' acid processing wet deck
6' HF processing wet deck
8' wet deck for anisotropic etching and electroplating
ECSI IKO Classic electroplating system (nickel, copper, tin, gold)
4' fume hood station
Semitool ST260D spin rinse dryer
Dicing, Packaging, Polishing
K & S Wire Bonder
Polishing station
Isotemp oven
Diamond Touch wafer saw
Buehler Isomet 1000 diamond saw
Measurement, Analysis - Inside Cleanroom
Tencor Alpha Step 500 surface profiler, with 2 mm extended range
Nanometrics Nanospec 210 resist and dielectric thickness measurement system
Olympus BX51 microscope with digital camera
Toho FLX-2320 thin film stress measurement system
M-2000D Ellipsometer
Wafer thickness gauge
FPP-5000 Automatic Resistivity Meter (4 point probe based)
Cascade 4 point probe
Metricon 2010 Prism Coupler (not installed)
Testing, Measurement, Analysis - Outside Cleanroom
Digital Instruments Dimension 3100 scanning probe microscope
Digital Instruments MultiMode scanning probe microscope
Fogal Photomap 3D white/red light interferometer
Olympus BX51 microscope with digital video camera
Cascade probe station with digital video camera
Vacuum chamber for MEMS testing
Nano-Systems Fabrication Laboratory (NSFL)
Dept. Electrical and Computer Engineering
Price Faculty of Engineering